DocumentCode
3439062
Title
Breaking arc characteristics in various power supply frequencies
Author
Miki, Nobuhiko ; Sawa, Kenta
Author_Institution
Keio Univ., Yokohama
fYear
2007
fDate
16-19 Sept. 2007
Firstpage
284
Lastpage
288
Abstract
The movement to the high frequency is strong in communication systems. But semiconductors used in such systems are known to have various problems in high frequency. Therefore an electromechanical switch of supreme RF (radio frequency) characteristics in the insertion loss and isolation is expected. However, in RF range, the arc characteristics generated between electric contacts have not been clarified. In this research, we examine basic characteristics of the breaking arc in high frequency especially the arc duration and the V-I characteristic. According to the results, it turned out that the arc duration becomes shorter and the arc voltage becomes lower as the frequency rises. Therefore, less damage is expected. Further, this experiment was conducted by interrupting the circuit current at its peak value, where arcing duration is shorter than T/4 which is the time of current zero. But after the arc extinction of current zero, reignition occurs over 600 kHz, then arc duration is longer than T/4. The reignition behavior is examined by measuring arc waveform in higher frequency.
Keywords
circuit-breaking arcs; electric ignition; electrical contacts; high-frequency discharges; power supply circuits; V-I characteristics; arc duration; arc extinction; arc waveform; breaking arc characteristics; circuit current; electric contacts; electromechanical switch; high frequency range; insertion loss; power supply frequencies; reignition behavior; supreme radio frequency characteristics; Character generation; Circuits; Communication switching; Contacts; Frequency measurement; Insertion loss; Power semiconductor switches; Power supplies; Radio frequency; Voltage; V-I characteristic; arc duration; high frequency; reignition;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical contacts - 2007, the 53rd ieee holm conference on
Conference_Location
Pittsburgh, PA
Print_ISBN
1-4244-0837-7
Electronic_ISBN
1-4244-0838-5
Type
conf
DOI
10.1109/HOLM.2007.4318231
Filename
4318231
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