Title :
Automatic test generation for maximal diagnosis of linear analog circuits
Author :
Mir, S. ; Lubaszewski, M. ; Kolarik, V. ; Courtois, B.
Author_Institution :
TIMA, Grenoble, France
Abstract :
A fault-based multifrequency test generation and fault diagnosis procedure is proposed in this work. The procedure selects a minimal set of test measures and generates the minimal set of frequency tests which guarantee maximum fault coverage and maximal diagnosis of circuit AC hard/soft faults. The procedure is exemplified for several self-testable linear analog circuits
Keywords :
analogue circuits; automatic testing; circuit testing; fault diagnosis; linear network analysis; AC circuits; automatic test generation; fault diagnosis; hard faults; linear analog circuits; maximal diagnosis; multifrequency test generation; self-testing; soft faults; AC generators; Analog circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Fault diagnosis; Frequency measurement; Nonlinear equations;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494157
