Title :
A diagonal translation operator for the fast evaluation of two-dimensional transient wave fields
Author :
Lu, M. ; Wang, J. ; Ergin, A.A. ; Michielssen, A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
Accurate and efficient techniques for analyzing linear transient wave phenomena are of significant interest to many disciplines. Although integral equation based methods for analyzing two-dimensional (2D) transient phenomena have been studied extensively in the past they all suffer from a high computational complexity, which limits their application to practical problems. To accelerate the integral equation based analysis of three dimensional transient scattering phenomena, our group developed the three-dimensional plane wave time domain (PWTD) algorithm (Ergin et al., 1998). In this paper, we extend our previous work from three to two dimensions and propose a novel 2D PWTD algorithm that relies on a diagonal translation operator for the efficient evaluation of 2D wave fields. When used in conjunction with a marching-on-in-time (MOT) scheme, this algorithm drastically accelerates the integral equation based analysis of 2D transient scattering phenomena.
Keywords :
electromagnetic wave scattering; integral equations; mathematical operators; transient analysis; 2D PWTD algorithm; 2D transient scattering phenomena; 2D wave fields; MOT scheme; diagonal translation operator; integral equation based analysis; marching-on-in-time scheme; three dimensionaI transient scattering phenomena; three-dimensional plane wave time domain algorithm; two-dimensional transient wave fields; Acceleration; Acoustic scattering; Acoustic waves; Algorithm design and analysis; Computational electromagnetics; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic transients; Integral equations; Transient analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
DOI :
10.1109/APS.1999.789561