Title :
Low voltage current mirrors for built-in current sensors
Author :
Ramírez-Angulo, Jaime
Author_Institution :
Dept. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
fDate :
30 May-2 Jun 1994
Abstract :
A current mirror with low input voltage requirements is presented. Its application to implement high performance current sensors for IDDQ testing is discussed. Experimental results show that the circuit can operate with an input voltage of 0.2 V. Simulations show feasibility of the circuit to operate as a high speed built-in current sensor with minimum disturbance on the circuit under test
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; VLSI; amplifiers; electric current measurement; electric sensing devices; integrated circuit testing; 0.2 V; IDDQ testing; built-in current sensors; high speed sensor; low voltage current mirrors; Bipolar transistors; Circuit testing; Current supplies; Degradation; Low voltage; MOSFETs; Mirrors; Sensor phenomena and characterization; Threshold voltage; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.409429
