DocumentCode :
3439384
Title :
Notice of Retraction
Optimal design of double stresses accelerated life test with competing risks
Author :
Ya-Feng Meng ; Zhi-Wang Sun ; Gang Pan ; Yue-Jiang Li
Author_Institution :
Ordnance Eng. Coll., Shijiazhuang, China
fYear :
2013
fDate :
15-18 July 2013
Firstpage :
1097
Lastpage :
1101
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

In order to shorten test time and realize rapid evaluation of the reliability of high reliability and long lifetime competing risk products, based on the rules of optimum design plan of double stresses accelerate life test, this paper presents a method of simulation based on optimal designs for double stresses accelerated life test with competing risks (CRDS-ALT) and presents a procedure of the test with Monte-Carlo, the asymptotic variance estimation of 100pth percentile of the lifetime distribution of the product at use condition were considered as goal function. Through defining each test stress level and the test censoring numbers of corresponding stress as the design variables, we makes statistics of analysis with MLE theory, and establishes the optimal designed model of double stresses accelerated life test with competing risks based on simulation. Based on the interpolation fitting theory, the target function is presented, which reduces the emulation scale, improves the efficiency of the test, and provides a technical support for optimal design for AT in life prediction of electronic equipment.
Keywords :
Monte Carlo methods; electronic equipment testing; interpolation; life testing; maximum likelihood estimation; optimisation; reliability; risk management; stress analysis; CRDS-ALT; MLE theory; Monte-Carlo method; asymptotic variance estimation; competing risk product; design variables; double-stress accelerate life test; electronic equipment life prediction; emulation scale reduction; goal function; interpolation fitting theory; optimal AT design plan; product lifetime distribution; reliability evaluation; statistical analysis; target function; test censoring numbers; test efficiency improvement; test stress level; test time reduction; use condition; Data models; Failure analysis; Fitting; Interpolation; Life estimation; Optimization; Stress; accelerated life test; competing risk; interpolation fitting; optimal design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
Type :
conf
DOI :
10.1109/QR2MSE.2013.6625757
Filename :
6625757
Link To Document :
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