• DocumentCode
    3439410
  • Title

    The role of p-type buffer layers between ZnO:Al and P a-SiC:H for improving fill factor and Voc of a-Si:H solar cells

  • Author

    Lee, Ji Eun ; Chung, Jin-Won ; Lee, Jeong Chul ; Cho, Jun Sik ; Kim, Young Kuk ; Yi, Junsin ; Kim, Dong Hwan ; Song, Jinsoo ; Yoon, Kyung Hoon

  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    This study addresses the role of p-type buffer layers between ZnO:Al (AZO) TCO and p a-SiC:H window layer. When AZO is used as a front TCO in conventional a-Si:H solar cells incorporating p a-SiC:H window, the fill factor (FF) significantly decreases in different with SnO2:F (FTO). Various buffer layers with different conductivity and crystalline properties are inserted between AZO and p a-SiC:H and solar cell performances are compared. The FF deterioration of AZO/p a-SiC:H cells is directly related to the interface potential barrier. This potential barrier can be controlled by tuning electron affinity and mobility gap as well as electrical conductivity of buffer layers. The p ¿c-Si:H buffer improves FF up to 0.72, which results from high conductivity of buffer layer. The p a-Si:H buffers also improves FF although they have similarly low conductivity with p a-SiC:H because of low electron affinity and/or mobility gap.
  • Keywords
    aluminium; buffer layers; electrical conductivity; electron affinity; electron mobility; silicon; solar cells; zinc compounds; Si:H; VOC; ZnO:Al; a-Si:H solar cells; conductivity properties; crystalline properties; electrical conductivity; electron affinity; fill factor; interface potential barrier; mobility gap; p-type buffer layers; window layer; Buffer layers; Conductive films; Conductivity; Electrodes; Epitaxial growth; Glass; Molecular beam epitaxial growth; Substrates; Transistors; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411181
  • Filename
    5411181