DocumentCode :
3439473
Title :
Micro-machines for moving nm-scale objects
Author :
MacDonald, Noel C.
Author_Institution :
Nat. Nanofabrication Facility, Cornell Univ., Ithaca, NY, USA
fYear :
1995
fDate :
4-6 Oct 1995
Firstpage :
53
Abstract :
Summary form only given. A suite of microinstruments has been fabricated from single crystal silicon (SCS) using micromachining technology. Using, a high-aspect-ratio, SCS process, we have fabricated a microtribology machine, a microtensile machine and the world´s smallest Scanning Tunneling Microscope (STM), measuring 200 micrometers on-a-side. We discuss the fabrication and operation of movable, integrated actuators that produce nm-scale, precision motion, and show the first STM image obtained with a microSTM. Self supporting, movable single crystal silicon springs and electric-field drive structures with integrated, movable field emission and tunneling tips are described. These integrated devices include integrated resonant mass sensors, precision x-y-z microstages for instrument and sensor applications including scanning tunneling structures. In particular we discuss the fabrication and operation of silicon-based microinstruments including microinstruments with integrated, nanometer-scale tips. Such microinstruments include STM, AFM, scanned-probe instruments, electron beam instruments, atom and molecular manipulators; and materials-testing microinstrumentation. We discuss two SCS processes used to fabricate microinstruments 3D tip scanning. Array-architectures offer potential for smart, programmable (electrically or mechanically) tip-arrays; array cathodes for electron beam instruments; array sensors; and information storage systems with nm-scale per bit storage. Materials properties of interest include internal friction and fatigue
Keywords :
arrays; atomic force microscopy; instruments; intelligent actuators; intelligent sensors; laboratory techniques; manipulators; microactuators; micromachining; micromechanical resonators; microsensors; nanotechnology; physical instrumentation control; scanning probe microscopy; scanning tunnelling microscopy; silicon; test equipment; vacuum microelectronics; 3D tip scanning; STM; array cathodes; array sensors; atom manipulators; atomic force microscopes; electric-field drive structures; electron beam instruments; fabrication; high-aspect-ratio; integrated field emission/tunneling tips; integrated resonant mass sensors; large dense arrays; materials testing instrumentation; microinstruments; micromachines; micromachining technology; microtensile machine; microtribology machine; molecular manipulators; movable integrated actuators; moving nm-scale objects; nanometer-scale tips; precision x-y-z microstages; scanned-probe instruments; scanning tunneling structures; self supporting movable springs; single crystal Si; smart programmable tip arrays; Actuators; Atomic force microscopy; Electron beams; Fabrication; Instruments; Micromachining; Sensor arrays; Silicon; Springs; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Machine and Human Science, 1995. MHS '95., Proceedings of the Sixth International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-2676-8
Type :
conf
DOI :
10.1109/MHS.1995.494217
Filename :
494217
Link To Document :
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