DocumentCode
3439632
Title
User-centric digital test architecture
Author
Jones, Chris ; McGoldrick, Mike
Author_Institution
Assembly Test Div., Teradyne, Inc., North Reading, MA
fYear
2005
fDate
26-29 Sept. 2005
Firstpage
666
Lastpage
673
Abstract
This paper describes a combination of digital test instrument features that improve productivity and performance of digital tests by supporting their specification from the UUT´s data sheet. Adaptive hardware features that allow this include: flexible timing, dynamic instrument reconfiguration, automatic handshaking, data compression, serial and asynchronous event handling, and hardware subroutines. These architectural features give the test engineer more flexibility, make test writing more efficient, and offer the possibility of more test coverage and analysis. The proposed modular design approach allows for more configurable and cost-efficient systems
Keywords
automatic test equipment; digital instrumentation; integrated circuit testing; logic testing; asynchronous event handling; automatic handshaking; data compression; digital test instrument; dynamic instrument reconfiguration; hardware subroutines; serial event handling; user-centric digital test architecture; Algorithms; Assembly; Circuit testing; Electronic equipment testing; Hardware; Instruments; Logic; Programming profession; Protocols; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2005. IEEE
Conference_Location
Orlando, FL
Print_ISBN
0-7803-9101-2
Type
conf
DOI
10.1109/AUTEST.2005.1609214
Filename
1609214
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