• DocumentCode
    3439632
  • Title

    User-centric digital test architecture

  • Author

    Jones, Chris ; McGoldrick, Mike

  • Author_Institution
    Assembly Test Div., Teradyne, Inc., North Reading, MA
  • fYear
    2005
  • fDate
    26-29 Sept. 2005
  • Firstpage
    666
  • Lastpage
    673
  • Abstract
    This paper describes a combination of digital test instrument features that improve productivity and performance of digital tests by supporting their specification from the UUT´s data sheet. Adaptive hardware features that allow this include: flexible timing, dynamic instrument reconfiguration, automatic handshaking, data compression, serial and asynchronous event handling, and hardware subroutines. These architectural features give the test engineer more flexibility, make test writing more efficient, and offer the possibility of more test coverage and analysis. The proposed modular design approach allows for more configurable and cost-efficient systems
  • Keywords
    automatic test equipment; digital instrumentation; integrated circuit testing; logic testing; asynchronous event handling; automatic handshaking; data compression; digital test instrument; dynamic instrument reconfiguration; hardware subroutines; serial event handling; user-centric digital test architecture; Algorithms; Assembly; Circuit testing; Electronic equipment testing; Hardware; Instruments; Logic; Programming profession; Protocols; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2005. IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-9101-2
  • Type

    conf

  • DOI
    10.1109/AUTEST.2005.1609214
  • Filename
    1609214