DocumentCode
3439641
Title
Total dose irradiation effects in the μA741 operational amplifier with different biases
Author
Jian-Bo Liu ; Yuan Liu ; Jin-Li Cheng ; Yun-fei En ; Ting Zhang ; Yu-Juan He ; Fu-Yao Dong
Author_Institution
Sch. of Mater. & Energy, Guangdong Univ. of Technol., Guangzhou, China
fYear
2013
fDate
15-18 July 2013
Firstpage
1156
Lastpage
1159
Abstract
Total dose dependence of bias current and offset voltage in the linear operational amplifier μA741 with different bias is presented in this paper. The experimental results show that the bias current in the μA741 with grounded bias is significantly affected by the degradation of the differential input transistors. In addition, the offset voltage is affected by the degradation of bipolar transistors of the current source in the differential input stage.
Keywords
bipolar transistors; operational amplifiers; radiation effects; bias current; bipolar transistors; grounded bias; linear operational amplifier; offset voltage; total dose irradiation effects; Bipolar transistors; Degradation; Educational institutions; Junctions; Operational amplifiers; Radiation effects; Transistors; bias current; bipolar transistor; offset voltage; operational amplifier; total dose;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-1014-4
Type
conf
DOI
10.1109/QR2MSE.2013.6625772
Filename
6625772
Link To Document