• DocumentCode
    3439641
  • Title

    Total dose irradiation effects in the μA741 operational amplifier with different biases

  • Author

    Jian-Bo Liu ; Yuan Liu ; Jin-Li Cheng ; Yun-fei En ; Ting Zhang ; Yu-Juan He ; Fu-Yao Dong

  • Author_Institution
    Sch. of Mater. & Energy, Guangdong Univ. of Technol., Guangzhou, China
  • fYear
    2013
  • fDate
    15-18 July 2013
  • Firstpage
    1156
  • Lastpage
    1159
  • Abstract
    Total dose dependence of bias current and offset voltage in the linear operational amplifier μA741 with different bias is presented in this paper. The experimental results show that the bias current in the μA741 with grounded bias is significantly affected by the degradation of the differential input transistors. In addition, the offset voltage is affected by the degradation of bipolar transistors of the current source in the differential input stage.
  • Keywords
    bipolar transistors; operational amplifiers; radiation effects; bias current; bipolar transistors; grounded bias; linear operational amplifier; offset voltage; total dose irradiation effects; Bipolar transistors; Degradation; Educational institutions; Junctions; Operational amplifiers; Radiation effects; Transistors; bias current; bipolar transistor; offset voltage; operational amplifier; total dose;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-1014-4
  • Type

    conf

  • DOI
    10.1109/QR2MSE.2013.6625772
  • Filename
    6625772