Title :
Noise in CMOS LDOs
Author :
Profirescu, Ovidiu ; Dinca, Cristi ; Stanescu, Cornel
Author_Institution :
Centre of Excellence, EDIL Microelectron. R&D, Bucharest
fDate :
Oct. 15 2007-Sept. 17 2007
Abstract :
The paper presents the main noise sources in CMOS low dropout linear voltage regulators (LDOs), their simulation and measurement. The paper is focused on noise performance, which is of great importance for the design of CMOS circuits.
Keywords :
CMOS analogue integrated circuits; semiconductor device measurement; semiconductor device models; semiconductor device noise; voltage regulators; CMOS LDOS; CMOS circuits design; low dropout linear voltage regulators; CMOS process; Capacitors; Circuit noise; Frequency; Low voltage; Photonic band gap; Regulators; Resistors; Semiconductor device noise; Thermal resistance;
Conference_Titel :
Semiconductor Conference, 2007. CAS 2007. International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4244-0847-4
DOI :
10.1109/SMICND.2007.4519786
