DocumentCode :
3440048
Title :
Calculation of incoherent quantum 1/f frequency fluctuations in low-Q BAW and SAW quartz resonators
Author :
Handel, Peter H.
Author_Institution :
Dept. of Phys. & Astron., Missouri Univ., St. Louis, MO, USA
fYear :
1998
fDate :
27-29 May 1998
Firstpage :
502
Lastpage :
506
Abstract :
Quantum 1/f frequency fluctuations arise both in bulk acoustic wave and surface acoustic wave quartz resonators from the presence of the quantum 1/f effect in the process rates which remove phonons from the main oscillator mode. Therefore, these fluctuations come from the quantum 1/f noise present in the dissipation rate. The present paper includes the incoherence effects caused by the finite “size” of the phonons, measured by their finite intrinsic coherence length. The result of this calculation is a non-monotonic dependence of the 1/f frequency noise on resonator volume, marked first by a linear increase, and followed by a inverse proportionality with volume, as noticed by T.E. Parker at NIST. The I/V dependence is similar to the behavior noticed for current carriers in semiconductors and metals, where the coherence length refers to electrons and is much smaller
Keywords :
1/f noise; acoustic resonators; bulk acoustic wave devices; electron device noise; surface acoustic wave resonators; BAW quartz resonators; SAW quartz resonators; bulk acoustic wave resonators; coherence length; current carriers; dissipation rate; finite intrinsic coherence length; fluctuations; incoherent quantum 1/f frequency fluctuations; inverse proportionality; metals; non-monotonic dependence; phonons; quantum 1/f frequency fluctuations; quantum 1/f noise; resonator volume; semiconductors; surface acoustic wave quartz resonators; Acoustic noise; Acoustic waves; Coherence; Fluctuations; Frequency; Length measurement; Oscillators; Phonons; Semiconductor device noise; Surface acoustic waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location :
Pasadena, CA
ISSN :
1075-6787
Print_ISBN :
0-7803-4373-5
Type :
conf
DOI :
10.1109/FREQ.1998.717945
Filename :
717945
Link To Document :
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