• DocumentCode
    3440048
  • Title

    Calculation of incoherent quantum 1/f frequency fluctuations in low-Q BAW and SAW quartz resonators

  • Author

    Handel, Peter H.

  • Author_Institution
    Dept. of Phys. & Astron., Missouri Univ., St. Louis, MO, USA
  • fYear
    1998
  • fDate
    27-29 May 1998
  • Firstpage
    502
  • Lastpage
    506
  • Abstract
    Quantum 1/f frequency fluctuations arise both in bulk acoustic wave and surface acoustic wave quartz resonators from the presence of the quantum 1/f effect in the process rates which remove phonons from the main oscillator mode. Therefore, these fluctuations come from the quantum 1/f noise present in the dissipation rate. The present paper includes the incoherence effects caused by the finite “size” of the phonons, measured by their finite intrinsic coherence length. The result of this calculation is a non-monotonic dependence of the 1/f frequency noise on resonator volume, marked first by a linear increase, and followed by a inverse proportionality with volume, as noticed by T.E. Parker at NIST. The I/V dependence is similar to the behavior noticed for current carriers in semiconductors and metals, where the coherence length refers to electrons and is much smaller
  • Keywords
    1/f noise; acoustic resonators; bulk acoustic wave devices; electron device noise; surface acoustic wave resonators; BAW quartz resonators; SAW quartz resonators; bulk acoustic wave resonators; coherence length; current carriers; dissipation rate; finite intrinsic coherence length; fluctuations; incoherent quantum 1/f frequency fluctuations; inverse proportionality; metals; non-monotonic dependence; phonons; quantum 1/f frequency fluctuations; quantum 1/f noise; resonator volume; semiconductors; surface acoustic wave quartz resonators; Acoustic noise; Acoustic waves; Coherence; Fluctuations; Frequency; Length measurement; Oscillators; Phonons; Semiconductor device noise; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
  • Conference_Location
    Pasadena, CA
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-4373-5
  • Type

    conf

  • DOI
    10.1109/FREQ.1998.717945
  • Filename
    717945