Title :
Generic test station utilizing database and COTS technologies with an integrated logistic approach
Author :
du T Paul, C. ; Zeiler, G.R.
Author_Institution :
Logtonics, Centurion
Abstract :
This paper describes the process of developing and implementing a highly integrated generic maintenance support system for complex electronic line replaceable units (LRUs) and systems, based on practical experience in the field. The highly structured development process involves the use of commercially available automated tools all focused on providing a solution integrating data from the operational level, through to depot level and test data from various on-line or remote test stations to provide a consolidated repair process and record. Advance data from the operational level failure record interacts with the consolidated historic record of repair for the equipment type to quickly zero in on the downstream repair action, be it module replacement or module repair by component replacement. The integrated process includes data validation on the test application software, instrument drivers, test philosophy templates and test routines. The test station includes databases that store the drivers, test program sets (TPSs), the diagnostic reasoning system and S1000D data modules for use in interactive electronic technical manuals (IETMs). The key design criteria based on user requirements include a significantly reduced footprint for the test station and simplified TPS development, reducing time and costs. To add new resources or new unit under test (UUT) to the test station is easily done by drag & drop actions in the test station database using a graphical interface. The test station is not hardware dependant but based on a test system with a new driver based operating system and virtual instruments. This allows the capability to re-host legacy test benches with new software and the replacement of obsolete instruments. This philosophy reduces the capital investment required to replace obsolete test benches
Keywords :
automatic test equipment; logistics; virtual instrumentation; COTS technologies; complex electronic LRU; data validation; database technologies; diagnostic reasoning system; generic test station; graphical interface; integrated logistic approach; interactive electronic technical manuals; line replaceable units; operating system; operational level failure; remote test stations; test application software; test philosophy templates; test program sets; test station database; virtual instruments; Application software; Automatic testing; Databases; Driver circuits; Electronic equipment testing; Instruments; Logistics; Manuals; Software testing; System testing;
Conference_Titel :
Autotestcon, 2005. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9101-2
DOI :
10.1109/AUTEST.2005.1609240