DocumentCode
3440220
Title
High performance thin crystalline silicon solar cell grown on silicon-on-insulator
Author
Murcia, C. Paola ; Hao, Ruiying ; Biegala, Tom ; Honsberg, Christiana ; Barnett, Allen
Author_Institution
Univ. of Delaware, Newark, DE, USA
fYear
2009
fDate
7-12 June 2009
Abstract
High open circuit voltage (VOC) is a potential benefit of thin silicon solar cells. A new thin silicon solar cell structure is proposed using silicon-on-insulator (SOI) technology that investigates the properties of high voltage in thin silicon designs with an epitaxial emitter. Key design parameters are low rear and front surface recombination, low dark current and efficient light trapping. We propose a patterned emitter area on a SOI substrate. The advantages of this design are the passivation properties embedded in the buried oxide and the reduced junction area. With a uniform epitaxial emitter, the top contact shadowing can be designed to be 0%. Preliminary results show Voc > 525 mV and JSc > 20 mA/cm2 with_anti-reflection coating. This represents a substantial increase from previous work by Danos et al. which reported Voc < 500 mV and Jsc ~ 0.45 mA/cm2. This present design also demonstrates the effect of a smaller emitter area and reports higher performance parameters for reported silicon cells fabricated on SOI substrates.
Keywords
antireflection coatings; dark conductivity; elemental semiconductors; radiation pressure; semiconductor epitaxial layers; silicon; solar cells; surface recombination; thin film devices; Si; antireflection coating; buried oxide; dark current; epitaxial emitter; light trapping; open circuit voltage; passivation; reduced junction area; silicon-on-insulator; surface recombination; thin crystalline silicon solar cell; top contact shadowing; Circuits; Coatings; Crystallization; Dark current; Passivation; Photovoltaic cells; Shadow mapping; Silicon on insulator technology; Substrates; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411219
Filename
5411219
Link To Document