• DocumentCode
    3440386
  • Title

    Notice of Retraction
    Research of probability risk assessment based on expanded ESD dynamic system

  • Author

    Jianxin Huang ; Shubin Li ; Yaqin Bian

  • Author_Institution
    Air Force Eng. Univ., Xi´an, China
  • fYear
    2013
  • fDate
    15-18 July 2013
  • Firstpage
    1320
  • Lastpage
    1324
  • Abstract
    Notice of Retraction

    After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE\´s Publication Principles.

    We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

    The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

    In safety risk research of complex dynamic systems, many methods of improved dynamic system probability risk assessment (PRA) can not be applied widely in the field of engineering because of their limitation; therefore this paper introduces dynamical PRA conception. It studies the expanding of ESD on the base of existing event sequence diagram (ESD) to overcome the deficiency of symbol expressing capability of the ESD method. The paper invents some new logical modeling symbols like "N/K" gate, sequence gate, expandable gate and constraint, to enhance the modeling capability of the ESD and to overcome the drawbacks in connections with products and size of the ESD method. To enhance the ability of dealing with problems of dynamic PRA, the ESD modeling process and the layered model are studied in detail. In order to improve the comprehensive capability of ESD method, this paper explains ESD/FT method, and ESD/M method, to make it to have the capability of solving the complex dynamic PRA problem.
  • Keywords
    failure analysis; probability; risk analysis; PRA; event sequence diagram; expanded ESD dynamic system; probability risk assessment; safety risk research; Accidents; Analytical models; Electrostatic discharges; Fault trees; Markov processes; Risk management; Safety; ESD; PRA; dynamic system; safety risk;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-1014-4
  • Type

    conf

  • DOI
    10.1109/QR2MSE.2013.6625812
  • Filename
    6625812