DocumentCode :
3440400
Title :
Scanning near-field microwave microscope
Author :
Oliynyk, V.V. ; Launets, V.L.
Author_Institution :
Shevchenko (T.G.) State Univ., Kiev, Ukraine
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
860
Abstract :
We explored an experimental device of scanning near-field microwave microscope (SNFMM), where as probe used open end of coaxial waveguide. This piece of coaxial by help coaxial-waveguide transition was connected to panoramic measuring device of SWR and attenuation P2-65. Frequency characteristic of reverberation coefficient of such device bore resonance nature, broke down under minimums system, situated off λ0/2 one another, amount of which determines by waveguide piece length. Such a descriptions, as change of resonance frequency of minimum, value of the reverberation coefficient in minimum, width of resonance curve carry information about parameters of sounded matter such as dielectric penetrability, conductivity, presence of heterogeneities and their character. Used a piece of coaxial waveguide with section, providing single-mode a routine in select frequency range
Keywords :
microwave imaging; scanning probe microscopy; coaxial waveguide probe; resonance frequency; reverberation coefficient; scanning near-field microwave microscope; Acoustic waveguides; Attenuation measurement; Boring; Coaxial components; Frequency; Microscopy; Microwave devices; Probes; Resonance; Reverberation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics and Engineering of Millimeter and Sub-Millimeter Waves, 2001. The Fourth International Kharkov Symposium on
Conference_Location :
Kharkov
Print_ISBN :
0-7803-6473-2
Type :
conf
DOI :
10.1109/MSMW.2001.947336
Filename :
947336
Link To Document :
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