Determination of parameters of some materials for millimeter waves using multifrequency measuring of reflection characteristics

Author

Andreev, M.V.

Author_Institution

Dept. of Radiophys., Dniepropetrovsk Nat. Univ., Ukraine

Volume

2

fYear

2001

fDate

2001

Firstpage

887

Abstract

One of problems of applied radiophysics is the necessity of measuring (checking) of parameters of layered structures by non-contact methods. The developed investigations have shown an opportunity of solution of the given problem on the basis of radiowave multifrequency measuring of reflection from the explored structures. The approach to determination of parameters of some industrial materials and liquids using multifrequency measurement at millimeter wave frequencies have been considered

Keywords

electromagnetic wave reflection; inhomogeneous media; millimetre wave measurement; industrial liquids; industrial materials; layered structures; millimeter waves; multifrequency measurement; noncontact methods; reflection characteristics; Dielectric materials; Dielectric measurements; Extraterrestrial measurements; Frequency measurement; Liquids; Matrices; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Reflection;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Engineering of Millimeter and Sub-Millimeter Waves, 2001. The Fourth International Kharkov Symposium on

Conference_Location

Kharkov

Print_ISBN

0-7803-6473-2

Type

conf

DOI

10.1109/MSMW.2001.947346

Filename

947346