Title :
Some thoughts on the word error rate measurement of A/D converters
Author :
Chiorboli, Giovanni ; De Salvo, Barbara ; Franco, Giovanni ; Morandi, Carlo
Author_Institution :
Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy
Abstract :
The word error rate (WER) of an A/D converter quantifies the probability that a wrong output code occurs because of metastability, intrinsic noise or aperture uncertainty. It can be measured in real-time, as it is customary for very low WER converters, or by post processing, when the WER is more relevant. In the paper the possible causes of inaccuracy are analyzed. First, the existing methods are reviewed, then the errors which may arise from the conventional analysis of experimental data are discussed, and it is shown that these errors can be removed in the case of post processing. Finally, the requirements on the test bench noise are discussed in connection with the qualified error level (i.e. 1, 2, 4, .., 16 LSB) and with the expected error rate
Keywords :
analogue-digital conversion; circuit noise; circuit testing; electric variables measurement; measurement errors; phase noise; probability; A/D converters; ADC; aperture uncertainty; intrinsic noise; metastability; post processing; probability; qualified error level; test bench noise; word error rate measurement; Apertures; Clocks; Data analysis; Error analysis; Metastasis; Noise level; Phase noise; Sampling methods; Semiconductor device noise; Testing;
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
DOI :
10.1109/ICECS.1998.814034