DocumentCode
3441013
Title
A Design of the Temperature Test System Based on Grouping DS18B20
Author
Ping, LI ; Yucai, Zhou ; Zeng, Xiangjun ; Ting-Fang, Yang
Author_Institution
Changsha Univ. of Sci. & Technol., Changsha
fYear
2007
fDate
23-25 May 2007
Firstpage
188
Lastpage
191
Abstract
All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.
Keywords
field buses; microcontrollers; temperature sensors; DS18B20 sensors; IO bus; MCU; temperature test system; Circuits; Power supplies; Read only memory; Sensor systems; Software measurement; Software testing; System testing; Temperature distribution; Temperature sensors; Velocity measurement; DS18B20 Group; temperature test; time spent on the alternate test;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2007. ICIEA 2007. 2nd IEEE Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4244-0737-8
Electronic_ISBN
978-1-4244-0737-8
Type
conf
DOI
10.1109/ICIEA.2007.4318396
Filename
4318396
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