Title :
Low-contrast microscopic image enhancement based on multi-technology fusion
Author :
Chen, Weidong ; Mao, Xuegang ; Ma, Haoge
Author_Institution :
Sch. of Comput. Sci., Wuhan Univ. of Technol., Wuhan, China
Abstract :
For the phenomenon of low image contrast usually appearing in scanning electron microscope images, a low contrast microscopic image enhancement algorithm based on multi-technology fusion was proposed, in which the high frequency and low frequency components of images are separated to avoid the increased image noise, while the images was strengthened. Furthermore, the low contrast microscopic image enhancement was realized combining with Sobel operator, LoG operator and improved contrast limited adaptive histogram equalization method. Experimental results show that the proposed method highlights the image edges and details effectively, which can expand the dynamic grayscale range of image, increase the image contrast and entropy so lay the foundation for the microscopic image analysis and identification.
Keywords :
edge detection; image denoising; image enhancement; image fusion; scanning electron microscopes; LoG operator; Sobel operator; adaptive histogram equalization method; dynamic grayscale range; image edge; image noise; low contrast microscopic image enhancement; low frequency component; microscopic image analysis; multitechnology fusion; scanning electron microscope image; Approximation methods; Hafnium; Histograms; LoG operator; Sobel operator; contrast limited adaptive histogram equalization; image enhancement; microscopic image;
Conference_Titel :
Intelligent Computing and Intelligent Systems (ICIS), 2010 IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6582-8
DOI :
10.1109/ICICISYS.2010.5658369