Title :
An approach for online repair and yield enhancement of VLSI/WSI redundant memories
Author :
Shen, Y.-N. ; Lombardi, F.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
A novel approach to yield enhancement of VLSI/WSI memories by row/column repair is presented. This approach is based on an online technique which executes concurrently with the testing process. The proposed repair approach consists of a divide-and-conquer strategy in which the overall fault pattern is divided into partitions. This is based on two practical considerations: the occurrence of faulty clusters and the practice of dividing a large memory into smaller subarrays (partitions) for speeding up the process of finding the overall repair-solution
Keywords :
VLSI; circuit reliability; integrated circuit testing; integrated memory circuits; random-access storage; redundancy; VLSI/WSI redundant memories; divide-and-conquer; fault pattern; faulty clusters; online repair; partitions; row/column repair; subarrays; yield enhancement; Computer science; Costs; Manufacturing; Production; Random access memory; Read-write memory; Redundancy; Testing; Throughput; Very large scale integration;
Conference_Titel :
CompEuro '91. Advanced Computer Technology, Reliable Systems and Applications. 5th Annual European Computer Conference. Proceedings.
Conference_Location :
Bologna
Print_ISBN :
0-8186-2141-9
DOI :
10.1109/CMPEUR.1991.257472
