Title :
Fault detection and fault tolerance for the associative random access memory (ARAM)
Author :
Grosspietsch, K.E. ; Glaeser, U. ; Steinhausen, U.
Author_Institution :
Gesellschaft fur Math. und Datenverarbeitung mbH, Postfach, Germany
Abstract :
Problems of fault detection and fault tolerance for an innovative special associative memory architecture, the associative RAM (ARAM), are considered. Additional components to solve these problems are presented. The resulting reliability improvement of the ARAM is discussed. The extended architecture has been realized as a prototype by a VLSI implementation
Keywords :
VLSI; content-addressable storage; fault tolerant computing; random-access storage; VLSI; associative memory architecture; associative random access memory; fault detection; fault tolerance; reliability; Associative memory; CADCAM; Computer aided manufacturing; Decoding; Fault detection; Fault tolerance; Hardware; Random access memory; Read-write memory; Very large scale integration;
Conference_Titel :
CompEuro '91. Advanced Computer Technology, Reliable Systems and Applications. 5th Annual European Computer Conference. Proceedings.
Conference_Location :
Bologna
Print_ISBN :
0-8186-2141-9
DOI :
10.1109/CMPEUR.1991.257473
