• DocumentCode
    3441569
  • Title

    Rapid gate matching with don´t cares

  • Author

    Trullemans, A.-M. ; Zhang, Q.

  • Author_Institution
    Lab. de Microelectron., Univ. Catholique de Louvain, Belgium
  • fYear
    1996
  • fDate
    11-14 Mar 1996
  • Firstpage
    407
  • Lastpage
    411
  • Abstract
    At the end of logic synthesis, the technology mapping step maps the Boolean function on physical cells. This step is based on a matching check, the complexity of which depends on the number of library cell inputs, and increases if don´t cares are considered. The method presented here is based on fault analysis. Using a structural equivalent of the cell, it allows one to prune dramatically the design space, and derives at the same time the input phase. The experimental results show a real improvement in CPU time compared to ROBDD based Boolean matching, and are promising for handling complex cells
  • Keywords
    Boolean functions; logic CAD; logic design; Boolean function; don´t cares; fault analysis; logic synthesis; matching check; physical cells; rapid gate matching; structural equivalent; technology mapping; Boolean functions; Circuit faults; Costs; Data structures; Field programmable gate arrays; Input variables; Libraries; Programmable logic arrays; Space technology; Tree graphs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1996. ED&TC 96. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1066-1409
  • Print_ISBN
    0-8186-7424-5
  • Type

    conf

  • DOI
    10.1109/EDTC.1996.494333
  • Filename
    494333