DocumentCode :
3441569
Title :
Rapid gate matching with don´t cares
Author :
Trullemans, A.-M. ; Zhang, Q.
Author_Institution :
Lab. de Microelectron., Univ. Catholique de Louvain, Belgium
fYear :
1996
fDate :
11-14 Mar 1996
Firstpage :
407
Lastpage :
411
Abstract :
At the end of logic synthesis, the technology mapping step maps the Boolean function on physical cells. This step is based on a matching check, the complexity of which depends on the number of library cell inputs, and increases if don´t cares are considered. The method presented here is based on fault analysis. Using a structural equivalent of the cell, it allows one to prune dramatically the design space, and derives at the same time the input phase. The experimental results show a real improvement in CPU time compared to ROBDD based Boolean matching, and are promising for handling complex cells
Keywords :
Boolean functions; logic CAD; logic design; Boolean function; don´t cares; fault analysis; logic synthesis; matching check; physical cells; rapid gate matching; structural equivalent; technology mapping; Boolean functions; Circuit faults; Costs; Data structures; Field programmable gate arrays; Input variables; Libraries; Programmable logic arrays; Space technology; Tree graphs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
ISSN :
1066-1409
Print_ISBN :
0-8186-7424-5
Type :
conf
DOI :
10.1109/EDTC.1996.494333
Filename :
494333
Link To Document :
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