Title :
Towards a uniform notation for memory tests
Author :
Van de Goor, Ad J. ; Offerman, Aad ; Schanstra, Ivo
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
Historically many ways of expressing memory tests have been used; varying from special notations to the use of general purpose programming languages. A notation, originally introduced for march tests in 1990, has been adopted and extended by many researchers. This paper extends that notation, in a systematic way, to a memory test language which allows march tests, pseudo march tests (such as GALPAT) and tests involving topological neighborhoods (to cover pattern sensitive faults) to be expressed in a unified way. The syntax and semantics facilitate the specification of memory tests in a compact way and can be processed using standard tools such as LEX and YACC
Keywords :
automatic test software; computational linguistics; integrated circuit testing; integrated memory circuits; specification languages; GALPAT; MTL; march tests; memory test language; memory tests; pattern sensitive faults; pseudomarch tests; topological neighborhoods; Computer architecture; Computer languages; Fault detection; Legged locomotion; Semiconductor device testing; Semiconductor memory; System testing;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494335
