Towards a uniform notation for memory tests

Author

Van de Goor, Ad J. ; Offerman, Aad ; Schanstra, Ivo

Author_Institution

Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

fYear

1996

fDate

11-14 Mar 1996

Firstpage

420

Lastpage

427

Abstract

Historically many ways of expressing memory tests have been used; varying from special notations to the use of general purpose programming languages. A notation, originally introduced for march tests in 1990, has been adopted and extended by many researchers. This paper extends that notation, in a systematic way, to a memory test language which allows march tests, pseudo march tests (such as GALPAT) and tests involving topological neighborhoods (to cover pattern sensitive faults) to be expressed in a unified way. The syntax and semantics facilitate the specification of memory tests in a compact way and can be processed using standard tools such as LEX and YACC

Keywords

automatic test software; computational linguistics; integrated circuit testing; integrated memory circuits; specification languages; GALPAT; MTL; march tests; memory test language; memory tests; pattern sensitive faults; pseudomarch tests; topological neighborhoods; Computer architecture; Computer languages; Fault detection; Legged locomotion; Semiconductor device testing; Semiconductor memory; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1996. ED&TC 96. Proceedings

Conference_Location

Paris

ISSN

1066-1409

Print_ISBN

0-8186-7424-5

Type

conf

DOI

10.1109/EDTC.1996.494335

Filename

494335