DocumentCode :
3441644
Title :
High level CAD melds microsystems with foundries
Author :
Karam, J.M. ; Courtois, B. ; Bauge, M.
Author_Institution :
CMP, Grenoble, France
fYear :
1996
fDate :
11-14 Mar 1996
Firstpage :
442
Lastpage :
447
Abstract :
Computer-aided-design (CAD) software is needed to design microsystems without excessive complexity and design time. Currently available CAD tools, such as Cadence DF2 or Mentor Falcon Framework, need modifications before they can be used for the automated design of micromachined devices. Work at the CMP has extended the capabilities of Cadence OPUS to microsystem technology. The user is able to generate layout of a microsystem including electronic and non-electronic parts in a commonly used format (GDS2, CIF), run an extended DRC which submits the layout to design rules checks in process aspects and electrical aspects and, finally, extract parameters from the layout level to the netlist level. The extended extractor recognises electronic components as well as microstructures, such as bridges, cantilevers and membranes. A netlist is generated and the simulation can be executed by the means of parametrized behavioural models of these microstructures. Finally, a parametrized cells library has been built. These advances are described in the paper
Keywords :
CAD; digital simulation; electronic engineering computing; etching; micromachining; micromechanical devices; semiconductor process modelling; CAD software; CIF format; Cadence OPUS; GDS2 format; Si; automated design; bridges; cantilevers; computer-aided-design; design rules checks; extended extractor; high level CAD; layout generation; membranes; micromachined devices; microsystem design; netlist generation; parameters extraction; parametrized behavioural models; parametrized cells library; simulation; Biomembranes; Design automation; Etching; Foundries; Gas detectors; Mechanical sensors; Micromachining; Microstructure; Silicon; Thermal sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
ISSN :
1066-1409
Print_ISBN :
0-8186-7424-5
Type :
conf
DOI :
10.1109/EDTC.1996.494338
Filename :
494338
Link To Document :
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