Exploit analog IFA to improve specification based tests [of SC circuits]

Author

Atzema, Bert ; Zwemstra, Taco

Author_Institution

Philips Res. Lab., Eindhoven, Netherlands

fYear

1996

fDate

11-14 Mar 1996

Firstpage

542

Lastpage

546

Abstract

In the recent past Inductive Fault Analysis (IFA) has been exploited for several aspects of analog testing. These include, test development, DfT schemes qualification, and fault grading. However, little attention is paid towards exploiting IFA in the design domain. In this paper we undertake a case study demonstrating how IFA can be exploited for improving specification based testing by design measures. The case study shows that the fault escape rate is lowered while specification based tests guarantee the parametric behavior

Keywords

analogue integrated circuits; design for testability; fault diagnosis; integrated circuit testing; switched capacitor networks; DfT schemes qualification; SC circuits; analog IFA; analog testing; design domain; design measures; fault escape rate; fault grading; inductive fault analysis; parametric behavior; specification based tests; test development; Analog integrated circuits; Circuit analysis; Circuit faults; Circuit testing; Filters; Impedance; Signal analysis; Speech analysis; Switched capacitor circuits; Telephony;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1996. ED&TC 96. Proceedings

Conference_Location

Paris

ISSN

1066-1409

Print_ISBN

0-8186-7424-5

Type

conf

DOI

10.1109/EDTC.1996.494353

Filename

494353