Title :
Fast computation of substrate resistances in large circuits
Author :
van Genderen, A.J. ; Van Der Meijs, N.P. ; Smedes, T.
Author_Institution :
Delft Univ. of Technol., Netherlands
Abstract :
In this paper, we describe a method to quickly and accurately estimate substrate coupling effects in analog and mixed digital/analog integrated circuits. Unlike numerical methods, that can be used for circuits containing only a few hundreds of substrate terminals, the new method can quickly extract circuits containing many thousands of substrate terminals. Examples are given that show that the method is sufficiently accurate for practical circuit verification. The method has been implemented in the layout-to-circuit extractor Space
Keywords :
analogue integrated circuits; circuit analysis computing; digital simulation; integrated circuit noise; integrated circuit reliability; mixed analogue-digital integrated circuits; Space; analog integrated circuits; circuit verification; layout-to-circuit extractor; mixed digital/analog integrated circuits; substrate coupling effects; substrate resistances; substrate terminals; Analog integrated circuits; Circuit noise; Circuit simulation; Coupling circuits; Integrated circuit interconnections; Integrated circuit noise; Semiconductor device noise; Substrates; Voltage; Wire;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494356
