Title :
Advantages of flip chip technology in millimeter-wave packaging
Author :
Krems, T. ; Haydll, W.H. ; Massler, H. ; Rudiger, J.
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany
Abstract :
Power leakage into surface waves in monolithically integrated millimeter-wave circuits is to a great extent determined by the applied packaging technology. In this presentation it is shown that properly designed flip chip packages will not suffer from surface wave leakage. Coplanar waveguides on GaAs substrates are used to demonstrate the decisive differences in the leakage behavior of flip chip mounted MMICs and more conventional MMW packages, featuring surface mounted MMICs connected by wire bonds. All results are based on full wave spectral domain analysis and measurement data in the frequency range from 10 to 120 GHz.
Keywords :
MIMIC; MMIC; S-parameters; coplanar waveguides; flip-chip devices; integrated circuit measurement; integrated circuit packaging; microwave measurement; millimetre wave measurement; spectral-domain analysis; 10 to 120 GHz; GaAs; GaAs substrates; S-parameters; coplanar waveguides; flip chip mounted MMICs; flip chip technology; full wave spectral domain analysis; millimeter-wave packaging; monolithically integrated millimeter-wave circuits; power leakage; propagation constants; surface wave leakage; Coplanar waveguides; Flip chip; Gallium arsenide; Integrated circuit technology; MMICs; Millimeter wave circuits; Millimeter wave integrated circuits; Millimeter wave technology; Packaging; Surface waves;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.602967