• DocumentCode
    3442600
  • Title

    Long-term performance and reliability assessment of 8 PV arrays at Sandia National Laboratories

  • Author

    Granata, J.E. ; Boyson, W.E. ; Kratochvil, J.A. ; Quintana, M.A.

  • Author_Institution
    Photovoltaic Syst. Evaluation Lab., Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    In the last decade, c-Si module degradation rates of <1%/year have been reported. It is unclear if this degradation rate extends directly to the string level and what is the expected statistical spread of degradation rates. Nine photovoltaic (PV) arrays totaling nearly 100 kW at Standard Reporting Conditions are currently being used at Sandia National Laboratories (SNL) primarily for inverter testing. The measured power degradation of these arrays at the string level varied from no change over three years within measurement error to greater than 25% in three years. This paper outlines the methodology used to test the DC output, outlines analysis techniques used to evaluate the array performance, provides a current reliability assessment, presents the comparative data for up to five years of use and exposure, and discusses the methods used to track down the causes of unexpected string-level degradation.
  • Keywords
    elemental semiconductors; semiconductor device reliability; silicon; solar cell arrays; DC output; PV arrays; Sandia National Laboratories; Si; inverter testing; long-term performance; photovoltaic arrays; power degradation; reliability assessment; string-level degradation; Availability; Degradation; Inverters; Laboratories; Lighting; Measurement errors; Performance analysis; Photovoltaic systems; Solar power generation; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411336
  • Filename
    5411336