• DocumentCode
    3442628
  • Title

    Theory of hydrogen-related levels in semiconductors and oxides

  • Author

    Van de Walle, Chris G.

  • Author_Institution
    Dept. of Mater., California Univ., Santa Barbara, CA
  • fYear
    2005
  • fDate
    5-5 Dec. 2005
  • Lastpage
    403
  • Abstract
    Hydrogen plays a major role in the electronic properties of semiconductors, oxides, and their interfaces. This paper reviews the present understanding of hydrogen interactions with materials, based on first-principles calculations, and describes how a relatively simple model allows predicting the electronic behavior of hydrogen in a wide range of semiconductors and oxides. Specific predictions are discussed for novel channel materials and gate oxides
  • Keywords
    doping profiles; electric properties; hydrogen; interface phenomena; semiconductor materials; channel materials; electronic properties; gate oxides; hydrogen interactions; interfaces; semiconductors; Bonding; Electrons; Elementary particle vacuum; Hydrogen; Impurities; Predictive models; Reservoirs; Semiconductor devices; Semiconductor materials; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-9268-X
  • Type

    conf

  • DOI
    10.1109/IEDM.2005.1609362
  • Filename
    1609362