Title :
Challenges for IEC62108 testing
Author :
Petrina, I. ; Cueli, A.B. ; DÌaz, J. ; Moracho, J. ; Ariztimuno, X. ; Lagunas, A.R.
Author_Institution :
CENER, Sarriguren, Spain
Abstract :
The evaluation of durability, safety and performance of photovoltaic modules is becoming an important point when trying to establish a product into the market, mostly for the new technologies appearing. In that sense, the committee of experts dedicated to write the IEC standards, put together a set of tests that can allow deciding on those quality points. In this paper, a revision of major difficulties in implementing the tests according to recently issued IEC-62108, Ed.1 standard, for concentrator photovoltaic modules (CPV) and assemblies, is made. The content is structured starting with the concept of product certification followed by a summary of the different types of existing CPV modules and the implications of that into the tests proposed by IEC-62108. Finally a description of main differences between the new standard and the experienced IEC-61215:2005 for crystalline Silicon PV modules is presented.
Keywords :
IEC standards; elemental semiconductors; silicon; solar cells; solar energy concentrators; testing; IEC standards; IEC62108 testing; concentrator photovoltaic modules; crystalline silicon PV modules; Assembly; Certification; Crystallization; Optical interconnections; Optical receivers; Optical refraction; Photovoltaic systems; Qualifications; Solar power generation; Testing;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411355