• DocumentCode
    344312
  • Title

    Fast 3D-surface quality control

  • Author

    Leopold, Jürgen

  • Author_Institution
    Dept. of Calculation & Testing, Soc. for Production Eng. & Dev., Chemnitz, Germany
  • Volume
    1
  • fYear
    1999
  • fDate
    36342
  • Firstpage
    227
  • Abstract
    Inspection is the process of determining if a product deviates from a given set of specifications. Fast inspection usually involves measurement of specific part features such as assembly integrity, geometric dimensions and surface finish. The visual inspection of 3D-parts is a special task within manufacturing that has been automated. Different optical methods for 3D measurement include: the thin-films based laser scanning technique, the projected fringes method, the electronic speckle interferometry, white-light-interferometry, and SEM- and AFM-methods. In addition, stylus instruments and colorimeter measurements are also included. Advantages and disadvantages of different contemporary intelligent methods are discussed, they include: neural net based classification, fuzzy clustering, fractal analysis, and some industrial applications
  • Keywords
    automatic optical inspection; computer vision; laser beam applications; light interferometers; quality control; surface topography; 3D-surface measurement; AFM; SEM; assembly integrity; automatic optical inspection; electronic speckle interferometry; fractal analysis; fuzzy clustering; geometric dimensions; laser scanning technique; neural nets; projected fringes; quality control; surface finish; thin-films; white-light-interferometry; Adaptive optics; Assembly; Automatic optical inspection; Geometrical optics; Manufacturing automation; Optical interferometry; Quality control; Speckle; Surface finishing; Thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Processing and Manufacturing of Materials, 1999. IPMM '99. Proceedings of the Second International Conference on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-5489-3
  • Type

    conf

  • DOI
    10.1109/IPMM.1999.792479
  • Filename
    792479