• DocumentCode
    3443689
  • Title

    On improved channel estimation for OFDM systems using the additive eigen value inflation factor approach

  • Author

    Prabhu, Vinay Uday ; Jalihal, Devendra

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Madras
  • fYear
    2008
  • fDate
    28-30 April 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Knowledge about the true temporal tap delay locations of the wireless channel allows construction of the CRLB attaining modified-Least squares or the MLS channel estimator. However, there exist several biased estimation paradigms which breach the CRLB for the unbiased counterparts, and which render the MLS inadmissible for orders of parameter estimation greater than 2.Harnessing the fact that the specular wireless channel is often characterized by more than two taps, we propose to exploit the much forgotten Bhattacharya´s algorithm to construct the biased generalized ridge regression estimator [GRRE]. The algorithm provides us with optimal values of the so-called additive Eigen value inflation factors which when incorporated within the GRRE framework, guarantee a reduced MSE over the MLS estimator. We analytically derive the attainment of the CRLB for biased estimators and then prove that there always exists a positive threshold SNR over which the proposed estimator outperforms the MLS estimator. Further, we show that the proposed estimator elegantly reduces to the optimal MLS solution at high SNRs, and hence does not experience any MSE floors. We conclude by showcasing the optimality of the proposed estimator through simulations involving vehicular channel estimation.
  • Keywords
    OFDM modulation; channel estimation; eigenvalues and eigenfunctions; least mean squares methods; regression analysis; Bhattacharya algorithm; Cramer Rao lower bound; OFDM system; additive eigenvalue inflation factor; channel estimation; generalized ridge regression estimator; modified-least squares; wireless channel; Additive noise; Analytical models; Channel estimation; Data models; Delay effects; Delay estimation; Frequency domain analysis; Frequency estimation; Multilevel systems; OFDM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sarnoff Symposium, 2008 IEEE
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    978-1-4244-1843-5
  • Type

    conf

  • DOI
    10.1109/SARNOF.2008.4520122
  • Filename
    4520122