Double-Stacked MoSi2-Barrier Junctions for Programmable Josephson Voltage Standards

Author

Chong, Y. ; Burroughs, C.J. ; Dresselhaus, P.D. ; Hadacek, N. ; Yamamori, H. ; Benz, S.P.

Author_Institution

National Inst. of Stand. & Technol., Boulder, CO

fYear

2004

fDate

38139

Firstpage

6

Lastpage

7

Abstract

We are developing MoSi₂-barrier stacked-junction arrays for Josephson voltage standards in order to increase the output voltage, operating bandwidth, and operating margins. In this paper we present measurements of a programmable voltage standard circuit with double-stacked arrays, where two junctions are fabricated in each stack. Although a mask defect prevented operation of one-eighth of the fabricated junctions, the remaining circuit, with a total of 51,344 junctions, succeeded in producing an output of 1.93 V with a range of operating current greater than 1 mA for the combined 13 subarrays

Keywords

measurement standards; molybdenum compounds; superconducting arrays; superconductor-normal-superconductor devices; voltage measurement; 1.93 V; Josephson voltage standards; MoSi₂; mask defect; programmable voltage standard circuit; superconducting arrays; Circuits; Critical current; Electrodes; Josephson junctions; Microwave antenna arrays; Niobium; Sputter etching; Superconducting microwave devices; Voltage; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 2004 Conference on

Conference_Location

London

Print_ISBN

0-7803-8494-6

Electronic_ISBN

0-7803-8494-6

Type

conf

DOI

10.1109/CPEM.2004.305372

Filename

4097086