Title :
Software Quality Metrics and their Impact on Embedded Software
Author :
Oliveira, Marcio F S ; Redin, Ricardo Miotto ; Carro, Luigi ; Lamb, Luís Da Cunha ; Wagner, Flávio Rech
Author_Institution :
Inst. of Inf., UFRGS, Porto Alegre
Abstract :
Although many improvements for software development are proposed by software engineers, the embedded system community faces a hard task in applying these improvements to software development, due to the strong dependence between software and hardware in embedded systems, which raises a trade-off between software quality, measured by traditional metrics, and optimization for a specific platform. Traditional software quality concerns reuse, abstraction, coupling, and coherence. Such concepts are usually in conflict with performance, memory footprint, and other physical metrics used for design evaluation in embedded systems. The purpose of this work is to evaluate the relationship between quality metrics for software products and physical metrics for embedded systems, in order to guide an embedded designer in selecting the best alternative design during design space exploration already at the model level. After the experiments, we could analyze the correlation between these metrics and highlight the behavior for quality and physical metrics, which help us to better understand the trade-off between reuse and optimization.
Keywords :
embedded systems; software metrics; software process improvement; software quality; software reusability; embedded software; software development; software optimization; software process improvement; software quality metrics; software reuse; Embedded software; Embedded system; Hardware; Programming; Software design; Software measurement; Software quality; Space exploration; Systems engineering and theory; Time to market; Embedded Software; Metrics; Physical Properties; Software Quality;
Conference_Titel :
Model-based Methodologies for Pervasive and Embedded Software, 2008. MOMPES 2008. 5th International Workshop on
Conference_Location :
Budapest
Print_ISBN :
978-0-7695-3104-5
DOI :
10.1109/MOMPES.2008.11