• DocumentCode
    3444381
  • Title

    Progress in high-efficiency terrestrial concentrator solar cells

  • Author

    Jones, R.K. ; Hebert, P. ; Pien, P. ; King, R.R. ; Bhusari, D. ; Brandt, R. ; Al-Taher, O. ; Fetzer, C. ; Ermer, J.

  • Author_Institution
    Spectrolab, Inc., Sylmar, CA, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    Multijunction solar cells based on III-V semiconductors are the most efficient solar cells in the world, with record efficiencies of over 40%. These devices offer the promise of very competitive solar power systems exploiting the high efficiency devices under high optical concentration. To make this promise a reality, Spectrolab is conducting a multi-year program to develop solar cells with still higher efficiency and substantial cost reductions and to fully characterize and qualify them for reliable performance in the field. Qualification of a second generation cell technology has recently been completed. Cell performance, qualification, and field test data will be presented; progress on performance improvements, cost reductions, and manufacturing capacity plans will be discussed. Development of these high-performance multijunction CPV cells promises to break the bottleneck currently limiting growth in photovoltaic power generation.
  • Keywords
    III-V semiconductors; solar absorber-convertors; solar cells; III-V semiconductors; Spectrolab; cell performance; cell qualification; field test data; high-efficiency terrestrial concentrator solar cells; high-performance multijunction CPV cells; manufacturing capacity plans; multijunction solar cells; optical concentration; photovoltaic power generation; second generation cell technology; solar power systems; Costs; III-V semiconductor materials; Optical devices; Optical recording; Photovoltaic cells; Photovoltaic systems; Power system reliability; Qualifications; Solar energy; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411429
  • Filename
    5411429