Title :
Multi-finger power HBT model for nonlinear circuit simulation
Author :
Zhu, Yu. ; Cai, Qian ; Balasubramanian, R. ; Gerber, Jason
Author_Institution :
Ansoft Corp., Elmwood Park, NJ, USA
Abstract :
A multi-finger power HBT model is developed by incorporating multiple unit finger HBT models with a multi-port thermal network. Each unit finger HBT model exhibits temperature and bias variations. The multi-port thermal network represents self-heating and thermal coupling effects. This power HBT model, implemented in a nonlinear circuit simulator, can be used to perform DC, small signal, and large signal simulation. Unique behaviors of multi-finger HBT, such as current collapse and the decrease in power output, are reproduced. The influence of ballasting resistance is also investigated
Keywords :
circuit simulation; heterojunction bipolar transistors; multiport networks; nonlinear network analysis; semiconductor device models; thermal analysis; DC simulation; ballasting resistance; bias variation; current collapse; large signal simulation; multi-finger power HBT model; multi-port thermal network; nonlinear circuit simulation; power output; self-heating effects; small signal simulation; temperature variation; thermal coupling effects; Charge carrier processes; Circuit simulation; Coupling circuits; Electric resistance; Electron emission; Fingers; Heterojunction bipolar transistors; Nonlinear circuits; Temperature distribution; Voltage;
Conference_Titel :
Radio and Wireless Conference, 2001. RAWCON 2001. IEEE
Conference_Location :
Waltham, MA
Print_ISBN :
0-7803-7189-5
DOI :
10.1109/RAWCON.2001.947558
