Title :
Multicusp ion source for ion projection lithography
Author :
Lee, Y. ; Leung, K.N. ; Williams, M.D. ; Bruenger, W.H. ; Fallmann, W. ; Löschner, H. ; Stengl, G.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Abstract :
The need to extend to smaller and smaller features (sub-100 nm) in integrated circuits has created the necessity to investigate new technologies beyond optical lithography. Ion projection lithography (IPL) is an advanced lithographic concept that can provide the solution for the high volume fabrication of sub-100 nm integrated circuits, The IPL system requires low axial energy spread ions in order to minimise the chromatic aberration of the projected image on the wafer. Ion energy spread for the multicusp source has been reduced from 6 eV to below 2 eV by the use of a planar magnetic filter. Most recently, LBNL successfully reduced the energy spread to below 1 eV by employing a co-axial filter configuration. A similar source is being fabricated to be used for a novel IPL machine to be built by LMS in 1999 as part of the European MEDEA project headed by Siemens. This paper describes the multicusp ion source for lithography and shows some exposure results using this source
Keywords :
ion beam lithography; ion sources; MEDEA project; chromatic aberration; co-axial filter; integrated circuits; ion energy spread; ion projection lithography; multicusp ion source; Integrated circuit technology; Integrated optics; Ion sources; Least squares approximation; Lithography; Magnetic separation; Optical device fabrication; Optical filters; Particle beam optics; Photonic integrated circuits;
Conference_Titel :
Particle Accelerator Conference, 1999. Proceedings of the 1999
Conference_Location :
New York, NY
Print_ISBN :
0-7803-5573-3
DOI :
10.1109/PAC.1999.792782