DocumentCode
3444714
Title
Direct Resistance Comparisons from the QHR to 100 Megohm using a Cryogemic Current Comparator
Author
Elmquist, R. ; Hourdakis, E. ; Jarrett, D. ; Zimmerman, N.
Author_Institution
National Inst. of Stand. & Technol., Gaithersburg, MD
fYear
2004
fDate
38139
Firstpage
97
Lastpage
98
Abstract
We describe the operation of a cryogenic current comparator (CCC) bridge that attains high current sensitivity while maintaining stability under a range of measurement conditions. Measurements of 100 MCI standard resistors and cryogenic thin-film resistors have been made at low voltage levels, based directly on a quantized Hall resistance (QHR) standard
Keywords
bridge instruments; cryogenic electronics; current comparators; electric resistance measurement; quantum Hall effect; thin film resistors; MCI standard resistors; cryogenic current comparator; cryogenic thin-film resistors; quantized Hall resistance; Bridge circuits; Cryogenics; Current measurement; Electrical resistance measurement; Frequency; Measurement standards; Noise level; Resistors; SQUIDs; Superconducting device noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305459
Filename
4097133
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