Title :
Influence of Non-Ideal TRL Calibration Items on VNA S-Parameter Measurements
Author_Institution :
Phys.-Technische Bundesanstalt, Braunschweig
Abstract :
For the 7-term TRL calibration of a four-sampler vector network analyser (VNA), expressions are presented for the deviations of the S-parameters of two-port test objects (d.u.ts) as functions of the deviations from the ideal values of the S-parameters of the TRL standards used. The obtained sensitivity coefficients are suitable for the establishment of the uncertainty budget for the S-parameter measurement
Keywords :
S-parameters; calibration; network analysers; two-port networks; S-parameter measurements; TRL calibration; two-port test objects; vector network analysers; Calibration; Crosstalk; Equations; Impedance measurement; Length measurement; Measurement standards; Microprogramming; Reflection; Scattering parameters; Testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305484
