DocumentCode
3444923
Title
The nonlinear optical properties of silicon nanoclusters made by laser ablation and ion implantation
Author
Lalanne, E.N. ; Garcia, H. ; Johnson, A.M. ; Vijayalakshmi, S. ; Grebel, H.
Author_Institution
Dept. of Phys., New Jersey Inst. of Technol., Newark, NJ, USA
fYear
2001
fDate
11-11 May 2001
Firstpage
123
Lastpage
124
Abstract
Summary form only given. Recent measurements of high optical nonlinearity in Si nanoclusters has generated interest in their potential use as an optical switch. The study of the nonlinear optical properties of Si nanoclusters (NCs) made by laser ablation and ion implantation techniques is motivated by the need for materials that exhibit large values of the real part of the third order nonlinear susceptibility (/spl chi//sup (3)//sub Re/). This is essential for light controlled phase or refractive index modulation at low power. The novelty of laser ablated Si NCs embedded in a silica substrate is that the measured large nonlinearity results from the deposition of micron-sized droplets of Si composed of close-packed nanocrystallites of Si (3-50 nm). Z-scan measurements were performed to measure the real and imaginary part of /spl chi//sup (3)/, where the nonlinear refractive index (n/sub 2/) is related to /spl chi//sup (3)//sub Re/ and the nonlinear absorption (/spl beta/) to /spl chi//sup (3)//sub lm/.
Keywords
elemental semiconductors; ion implantation; nanostructured materials; nonlinear optical susceptibility; pulsed laser deposition; refractive index; silicon; 3 to 50 nm; Si nanoclusters; Si-SiO/sub 2/; Z-scan measurements; close-packed nanocrystallites; coupled phased array of dipoles; ion implantation; laser ablation; light controlled phase modulation; micron-sized droplets; nonlinear absorption; nonlinear optical properties; nonlinear refractive index; refractive index modulation; silica substrate; third order nonlinear susceptibility; Ion implantation; Laser ablation; Nonlinear optics; Optical materials; Optical refraction; Optical switches; Optical variables control; Particle beam optics; Refractive index; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-662-1
Type
conf
DOI
10.1109/CLEO.2001.947578
Filename
947578
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