• DocumentCode
    3444926
  • Title

    Enhanced Front and Rear dielectric passivation for commercially grown Czochralski silicon for high efficiency solar cells

  • Author

    Upadhyaya, A. ; Yelundur, V. ; Ramanathan, S. ; Lai, J.-H. ; Upadhyaya, V. ; Rohatgi, A. ; Koehler, L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    Commercial silicon solar cell efficiencies have been improving consistently over the last few years with the implementation of novel techniques. Along with larger wafer area and thinner substrates, low-cost processing of high efficiency solar cells can help achieve grid parity using crystalline silicon. In this work, large area cells were fabricated using conventional diffusion, oxidation and screen printing technologies. Several rear passivation schemes were compared to achieve low rear surface recombination velocities and combined with good front passivation to obtain cell VOC of ~650 mV. Cells fabricated using these schemes resulted in an efficiency of 19.7% on 4 cm2 cells and 18.5% on 62 cm2 cells. Analysis and characterization of these cells reveals the possibility of achieving cell efficiencies greater than 19% on large area substrates.
  • Keywords
    crystal growth from melt; diffusion; elemental semiconductors; oxidation; passivation; semiconductor growth; silicon; solar cells; surface recombination; Si; commercially grown Czochralski silicon; diffusion; front dielectric passivation; grid parity; high efficiency solar cells; oxidation; rear dielectric passivation; screen printing; surface recombination velocities; Coatings; Dielectrics; III-V semiconductor materials; Optical reflection; Optical refraction; Optical surface waves; Passivation; Photovoltaic cells; Silicon; Solar energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411457
  • Filename
    5411457