The aging of bulk acoustic wave resonators, filters and oscillators

Author

Vig, John R. ; Meeker, Thrygve R.

Author_Institution

US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ, USA

fYear

1991

fDate

29-31 May 1991

Firstpage

77

Lastpage

101

Abstract

The aging of quartz crystal resonators, filters, and oscillators is reviewed, including such topics as the impacts of aging, typical aging characteristics, aging specifications, aging mechanisms, temperature dependence of aging, frequency and overtone dependence of aging, drive level dependence of aging, the effects of aging interruptions, the dependence of aging on material and mode type, state-of-the-art in low-aging oscillators, and aging acceleration effects. The aging mechanisms discussed include contamination transfer effects, stress effects, electrode effects, diffusion effects, changes in the quartz material, and circuit and other electrical changes. Isothermal and thermal step stress aging acceleration methods are reviewed

Keywords

ageing; crystal resonators; filters; frequency stability; oscillators; quartz; SiO₂ crystal resonators; aging; aging acceleration effects; aging characteristics; aging interruptions; aging mechanisms; aging specifications; bulk acoustic wave resonators; contamination transfer effects; crystal cuts; diffusion effects; drive level dependence; electrode effects; filters; frequency aging; frequency dependence; isothermal stress aging acceleration methods; long term aging; low-aging oscillators; material dependence; mode type dependence; oscillators; overtone dependence; quartz crystal resonators; stress effects; temperature dependence; thermal step stress aging acceleration methods; Accelerated aging; Acoustic waves; Contamination; Crystalline materials; Electrodes; Frequency; Oscillators; Resonator filters; Temperature dependence; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control, 1991., Proceedings of the 45th Annual Symposium on

Conference_Location

Los Angeles, CA

Print_ISBN

0-87942-658-6

Type

conf

DOI

10.1109/FREQ.1991.145888

Filename

145888