Title :
Model Comparison to Synthesize a Model-Driven Software Product Line
Author :
Xiaorui Zhang ; Haugen, Oystein ; Moller-Pedersen, Birger
Author_Institution :
SINTEF ICT, Oslo, Norway
Abstract :
Current model-driven software product line development is mostly based on feature/variability modeling techniques, however, we see the potential for automatic assistance in identifying the commonality and variability of a set of models within the domain and synthesizing the product line model based on those. This paper presents a generic approach for synthesizing a software product line using model comparison. For model difference detection, the approach applies EMF Compare, a generic model comparison tool. For specifying the variability, the approach applies the Common Variability Language (CVL), a generic language for expressing variability. The SPL developer starts with comparing the existing potential product models in order to identify reusable assets (model fragments). Our tool prototype CVL Compare detects the difference between the existing product models and performs higher-order comparisons to explore the commonality and variability of the domain. Based on the comparison results, a preliminary product line model (CVL model) can be automatically induced and the SPL developer may further enhance the product line model. The approach is illustrated with an example of train control product line.
Keywords :
formal verification; software reusability; EMF Compare; SPL developer; common variability language; eclipse modeling framework; feature modeling technique; generic model comparison tool; model difference detection; model driven software product line development; reusable assets; train control product line; variability modeling technique; Automation; Companies; DSL; Engines; Object recognition; Software; Unified modeling language; Common Variability Language; model comparison; model-driven software product lines; synthesize a product line model; variability identification;
Conference_Titel :
Software Product Line Conference (SPLC), 2011 15th International
Conference_Location :
Munich
Print_ISBN :
978-1-4577-1029-2
DOI :
10.1109/SPLC.2011.24