Title :
Thickness-shear mode shapes and mass-frequency influence surface of a circular and electroded AT-cut quartz resonator
Author :
Yong, Y.-K. ; Stewart, J.T. ; Detaint, J. ; Zarka, A. ; Capelle, N. ; Zheng, Y.
Author_Institution :
Dept. of Civil & Environ. Eng., Rutgers Univ., Piscataway, NJ, USA
Abstract :
Finite-element solutions for the fundamental thickness shear mode and the second anharmonic overtone of a circular, 1.87-MHz AT-cut quartz plate with no electrodes are presented and compared with previous results for a rectangular plate of similar properties. The edge flexural mode in circular plates, a vibration mode not seen in the rectangular plate, is also presented. A 5-MHz circular and electroded AT-cut quartz plates is studied. A portion of the frequency spectrum is constructed in the neighborhood of the fundamental thickness-shear mode. A convergence study is presented for the electroded 5-MHz plate. A two-dimensional technique for visualizing the vibration mode solutions is presented. A contour plot of the mass-frequency influence surface for the plated 5-MHz resonator is presented. The mass-frequency influence surface is defined as a surface giving the frequency change due to a small localized mass applied to the resonator surface
Keywords :
crystal resonators; finite element analysis; quartz; 1.87 MHz; 5 MHz; AT-cut; SiO2 crystal resonators; circular electroded resonators; circular plates; edge flexural mode; frequency spectrum; fundamental thickness shear mode; mass-frequency influence surface; mode visualisation; quartz plate; quartz resonator; rectangular plate; second anharmonic overtone; small localized mass; two-dimensional technique; vibration mode solutions; Anisotropic magnetoresistance; Coordinate measuring machines; Eigenvalues and eigenfunctions; Electrodes; Equations; Finite element methods; Fluctuations; Frequency; Shape; Surface contamination;
Conference_Titel :
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-658-6
DOI :
10.1109/FREQ.1991.145895