DocumentCode
3445213
Title
Present Status of the a Vogadro Constant Determination from Silicon Crystals with Natural Isotopic Composition
Author
Fujii, K. ; Waseda, A. ; Kuramoto, N. ; Mizushima, S. ; Becker, P. ; Bettin, H. ; Nicolaus, A. ; Kuetgens, U. ; Valkiers, S. ; Taylor, P. ; De Bièvre, P. ; Mana, G. ; Massa, E. ; Matyi, R.
Author_Institution
Nat. Metrol. Inst. of Japan, Ibaraki
fYear
2004
fDate
38139
Firstpage
143
Lastpage
144
Abstract
The determination of the Avogadro constant from two selected silicon crystals is described. The density, molar mass, and lattice spacing of the two crystals were measured at NMU, PTB, IRMM, IMGC, and NIST. When all the data are combined, it leads to the Avogadro constant of 6.022 1353 (21) times 1023 mol-1 with a relative combined standard uncertainty of 3.4 times 10-7
Keywords
lattice constants; silicon; Avogadro constant determination; Si; natural isotopic composition; relative combined standard uncertainty; silicon crystals; Composite materials; Covariance matrix; Crystals; Density measurement; Lattices; Least squares approximation; Metrology; NIST; Pressure measurement; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305501
Filename
4097156
Link To Document