• DocumentCode
    3445272
  • Title

    Joint IMGC-NMIJ Measurement of the Si (220) Lattice Spacing

  • Author

    Fujimoto, H. ; Mana, G. ; Massa, G. ; Nakayama, K.

  • Author_Institution
    Nat. Metrol. Inst. of Japan, Ibaraki
  • fYear
    2004
  • fDate
    38139
  • Firstpage
    149
  • Lastpage
    150
  • Abstract
    Further details are given of a measurement of the (220) lattice spacing of silicon carried out by jointly the Istituto di Metrologia "G. Colonnetti" and the National Metrology Institute of Japan
  • Keywords
    lattice constants; silicon; IMGC-NMIJ measurement; Si; Si (220) lattice spacing; lattice spacing measurement; Atom optics; Atomic measurements; Displacement measurement; Lattices; Metrology; Motion control; Motion measurement; Optical interferometry; Optical scattering; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2004 Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-8494-6
  • Electronic_ISBN
    0-7803-8494-6
  • Type

    conf

  • DOI
    10.1109/CPEM.2004.305504
  • Filename
    4097159
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3445272