• DocumentCode
    3445500
  • Title

    Dependability modeling and evaluation of phased mission systems: a DSPN approach

  • Author

    Mura, I. ; Bondavalli, A. ; Zang, X. ; Trivedi, K.S.

  • Author_Institution
    Dept. of Inf. Eng., Pisa Univ., Italy
  • fYear
    1999
  • fDate
    8-8 Jan. 1999
  • Firstpage
    319
  • Lastpage
    337
  • Abstract
    We focus on analytical modeling for the dependability evaluation of phased-mission systems. Because of their dynamic behavior, systems showing a phased behavior offer challenges in modeling. We propose the modeling and evaluation of phased-mission system dependability through the Deterministic and Stochastic Petri Nets (DSPN). The DSPN approach to the phased-mission systems offers many advantages, concerning both the modeling and the solution. The DSPN model of the mission can be a very concise one, and it can be efficiently solved for dependability evaluation purposes. The solution procedure is supported by the existence of an analytical solution for the transient probabilities of the marking process underlying the DSPN model. This analytical solution can be fully automated. We show how the DSPN model capabilities are able to deal with various peculiar features of phased-mission systems, including those systems where the next phase to be performed can be chosen at the time the preceding phase ends.
  • Keywords
    Markov processes; Petri nets; performance evaluation; stochastic processes; DSPN approach; DSPN model; Deterministic and Stochastic Petri Nets; analytical modeling; analytical solution; dependability evaluation; dependability modeling; dynamic behavior; marking process; phased behavior; phased mission systems; phased-mission system dependability; transient probabilities; Analytical models; Bonding; Closed-form solution; Information analysis; Performance evaluation; Petri nets; Power system modeling; Proposals; Stochastic systems; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing for Critical Applications 7, 1999
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7695-0284-9
  • Type

    conf

  • DOI
    10.1109/DCFTS.1999.814303
  • Filename
    814303