• DocumentCode
    3445532
  • Title

    Quartz resonator sensors in extreme environments

  • Author

    EerNisse, Errol P. ; Ward, Roger W.

  • Author_Institution
    Quartztronics Inc., Salt Lake City, UT, USA
  • fYear
    1991
  • fDate
    29-31 May 1991
  • Firstpage
    254
  • Lastpage
    260
  • Abstract
    The authors present data on the tensile failure of quartz obtained from testing miniature force sensors of the double-ended tuning fork configuration. Dauphine twinning threshold data for temperatures ranging from room temperature to 175°C are presented. The experimental twinning results are supported by calculations of the Gibbs free energy difference between the two twin states. Additional calculations of the Gibbs free energy difference are presented for the SC-cut for comparison to the AT-cut and the X-cut used in published twinning studies. Both uniaxial stress conditions and biaxial stress patterns are included in the theoretical results to quantitatively compare the present experimental situation to earlier work. The fact that the present biaxial stress study is consistent with earlier uniaxial results confirms the use of the free energy difference as a theoretical tool to predict twinning thresholds in complicated stress pattern situations
  • Keywords
    crystal resonators; electric sensing devices; environmental testing; failure analysis; quartz; stress analysis; tensile strength; tensile testing; twinning; 20 to 175 degC; AT-cut; Dauphine twinning threshold data; Gibbs free energy difference; SC-cut; SiO2; X-cut; biaxial stress patterns; double-ended tuning fork; extreme environments; miniature force sensors; quartz; tensile failure; testing; uniaxial stress conditions; Etching; Force sensors; Frequency control; Manufacturing; Temperature distribution; Temperature sensors; Tensile stress; Testing; Transducers; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    0-87942-658-6
  • Type

    conf

  • DOI
    10.1109/FREQ.1991.145910
  • Filename
    145910