Title :
Characterization of 0.5 mm thick films of orientation-patterned GaAs for nonlinear optical applications
Author :
Pinguet, T.J. ; Levi, O. ; Skauli, T. ; Eyres, L.A. ; Scaccabarozzi, L. ; Fejer, M.M. ; Harris, J.S. ; Kulp, T.J. ; Bisson, S. ; Gerard, B. ; Becouarn, L. ; Lallier, E.
Author_Institution :
Solid State & Photonics Lab., Stanford Univ., CA, USA
Abstract :
Summary form only given. Quasi-phasematched frequency conversion in orientation-patterned GaAs (OPGaAs) is a promising way to generate mid-infrared radiation from near-infrared laser sources. GaAs has very attractive properties for such applications: a large nonlinear susceptibility (d/sub 14//spl sim/90 pm/V), transparency between 1 and 12 /spl mu/m, a high thermal conductivity (46 W/m-K), and a high optical damage threshold (60 MW/cm/sup 2/ for 10 ns pulses). We report optical and crystallographic properties of epitaxial OPGaAs films with a thickness as large as 0.5 mm, sufficient for these materials to be useful in a wide variety of nonlinear optical applications.
Keywords :
III-V semiconductors; gallium arsenide; infrared sources; molecular beam epitaxial growth; nonlinear optical susceptibility; optical films; optical frequency conversion; optical losses; optical materials; optical parametric oscillators; optical phase matching; semiconductor epitaxial layers; thermal conductivity; transparency; 0.5 mm; 10 ns; 12 to 12 micron; GaAs; crystallographic properties; epitaxial films; mid-infrared radiation; near-infrared laser sources; nonlinear optical applications; nonlinear susceptibility; optical damage threshold; optical properties; orientation-patterned material; quasi-phasematched frequency conversion; thermal conductivity; thick films; thickness; transparency; Conducting materials; Crystalline materials; Crystallography; Frequency conversion; Gallium arsenide; Nonlinear optics; Optical films; Optical pulses; Thermal conductivity; Thick films;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
DOI :
10.1109/CLEO.2001.947610
