Title :
Optical damage and light-induced absorption in near-stoichiometric LiTaO/sub 3/ crystal
Author :
Kitamura, Kokoro ; Furukawa, Yudai ; Takekawa, Shunji ; Nakamura, Mitsutoshi ; Alexandrovski, A. ; Fejer, M.M.
Author_Institution :
Nat. Inst. for Res. in Inorg. Mater., Tsukuba, Japan
Abstract :
Summary form only given. Recently, Kitamura et al. (1999) compared the electric fields required for ferroelectric domain reversal between the conventional congruent LiTaO/sub 3/ crystal (CLT) and a near-stoichiometric one (SLT) which was grown by a novel double crucible Czochralski method equipped with an automatic powder supply system. It was found that the electric field for domain switching in SLT was decreased to be less than 1.7 kV/mm. This value is about one thirteenth of that for the conventional CLT. This low coercive field in SLT is increasing the interest in domain engineering of optical devices for a variety of frequency conversion applications. We investigated nonstoichiometry dependence of undesirable photorefraction and light-induced absorption in LiTaO/sub 3/.
Keywords :
crystal growth from melt; electric domains; ferroelectric materials; ferroelectric switching; infrared spectra; lithium compounds; optical frequency conversion; optical materials; photoconductivity; photorefractive materials; photovoltaic effects; space charge; stoichiometry; LiTaO/sub 3/; automatic powder supply system; congruent crystal; domain engineering; domain switching; double crucible Czochralski method; electric fields; ferroelectric domain reversal; frequency conversion applications; light-induced absorption; low coercive field; near-stoichiometric crystal; nonstoichiometry dependence; optical damage; optical devices; photorefraction; Absorption; Frequency conversion; Gallium arsenide; Gratings; Molecular beam epitaxial growth; Nonlinear optics; Optical films; Optical pumping; Optical scattering; Optical sensors;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
DOI :
10.1109/CLEO.2001.947611